The SU3500 from Hitachi High-Technologies is a new variable pressure scanning electron microscope (VP-SEM) featuring a newly designed ultra-variable pressure detector and offering levels of performance previously unseen in this class of instrument. Attention to detail has been applied to all aspects of the instrument design, including the electron optics, detection system, vacuum system, chamber/stage and the user interface.
A newly developed low-aberration objective lens, coupled with the latest detection technology, gives incredible imaging performance, especially at low voltages. The new electron gun and advanced image processing system provide the highest signal-to-noise ratio for exceptional imaging clarity, while also making navigation and image adjustment easier to perform.
The newly developed user interface provides a truly intuitive operation experience, while making full use of the latest ultra-high-resolution monitors. Fast and accurate auto-functions, including a comprehensive auto-start feature, ensure quick and reliable imaging on any sample and by any user.
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